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Showing results: 406 - 420 of 613 items found.

  • Corona Effect Camera

    CoroCAM 7 - Amperis sl

    The CoroCAM 7 corona effect camera is a camera used to visualize and locate corona and electric arc discharges. This camera shares the same ultraviolet imaging system as coroCAM 6D, but additionally combines it with a high-performance visible camera and viewfinder. This camera is used for high voltage inspections.

  • Vision Measurement

    CMM Camera System - Aberlink Ltd

    Aberlink’s camera system offers a non-contact facility on any Aberlink CMM. A innovative design of magnetic, kinematic joint allows the probe and camera to be swapped in just seconds. This means that components can be inspected using both touch trigger and vision inspection technology on the same machine.

  • Four-sided Cant Scanning

    Logeye 600 - Microtec

    The Logeye 600 scanner is designed to analyze wooden cants in the sawmilling production process. The aim is to integrate the machine into profiler lines and into re-saws for high quality lumber production. The combination of automatic quality inspection allows an autonomous system for superior grade and high volume production.

  • Vacuum Inspection

    INDEC - KoCoS Messtechnik AG

    INDEC vacuum test systems monitor a wide range of containers during the production process, including bottles, jars and cans, by measuring the cap panel concavity of their closures which is dependent on the vacuum inside. This non-contact inspection reliably identifies defective containers for automatic rejection.

  • Constant Temperature & Humidity Chamber

    DRK-150F - Shandong Drick Instruments Co., Ltd.

    The constant temperature and humidity chamber has an accurate temperature and humidity control system, which provides various environmental simulation conditions required for industrial research and biotechnology testing, so it can be widely used in sterility tests, stability inspections such as pharmaceuticals, textiles, and food processing.

  • Substrate Manufacturing

    KLA-Tencor Corp

    KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.

  • Semiconductor Metrology Systems

    MTI Instruments

    MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.

  • Automated Test Equipment

    Viewpoint Systems, Inc

    Viewpoint Systems offers design verification and manufacturing quality inspection systems to help customers reduce human error in repetitive tests, increase testing speeds, and ultimately get products to market faster at a lower cost. Viewpoint Transforms Test from Design to End-of-Line. Our R&D test systems are designed with the flexibility to validate ever-changing prototypes while accelerating your development schedule.

  • Machine Vision Platform

    NeuralVision - Cyth Systems, Inc

    NeuralVision is a machine vision platform designed to allow an operator or supervisor with no previous experience to develop an inspection and measurement routine for their products. The operator need only provide as many examples of each type as possible for the system to scan. NeuralVision is the first such processing system to work with any type of camera or image including 2D gray-scale or color, plus 3D and infrared images.

  • Saluki S5700 Series Field Comm Analyzer (SA/CA/OPTICAL)

    Saluki Technology Inc.

    S5700 Series Field Comm Analyzer combines the highest performance operating specifications and multi-functional measurements such as cable and antenna system analysis, fiber inspection, spectrum analysis, cellular signal demodulation, interference analysis, signal coverage mapping and RF/optical power measurements in a single instrument.

  • Software to Order

    ViTec Co. Ltd

    Our company develops turnkey technical vision systems, including writing software for specific tasks of the Customer, such as:- image capture- algorithms for localization and detection of objects- recognitionalgorithms - inspection algorithms, defect detection- logging and archiving- interface operator- programming FPGAs and controllersand much more

  • High-Performance Handheld Infrared Camera

    FLIR T865 - Teledyne FLIR

    The FLIR T865 thermal imaging camera is a non-contact inspection tool with 180° rotating optical block that allows users to safely and comfortably assess the condition of critical electrical and mechanical equipment in utility and manufacturing applications. With advanced features including unmatched temperature measurements down to -40°C, accuracy as good as 1°C/1%, 1-Touch Level/Span contrast enhancement, and laser–assisted autofocus, you'll get highly accurate temperature measurements every time. Pair the T865 with a 6 FOV IR lens to perform inspections on small targets from long distances. The on-board Inspection Route system helps you record temperature data and imagery in a logical sequence for faster troubleshooting and repair. The T865 also features FLIR Ignite for automatic uploading of images directly from the camera to the cloud for easy, secure storage and sharing. Adding a FLIR T865 camera to a condition monitoring/predictive maintenance program can help reduce maintenance costs, improve system efficiency and reliability, and prevent downtime due to outages.

  • Compound Semi | MEMS | HDD Manufacturing

    KLA-Tencor Corp

    KLA has a comprehensive portfolio of inspection, metrology, and data analytics systems to support power devices, RF communications, LED, photonics, MEMS, CPV solar and display manufacturing. High brightness LEDs are becoming commonly used in solid-state lighting and automotive applications, and LED device makers are targeting aggressive cost and performance improvements, requiring more emphasis on improved process control and yield. Similarly, leading power device manufacturers are targeting faster development and ramp times, high product yields and lower device costs, and are implementing solutions for characterizing yield-limiting defects and processes. KLA's inspection, metrology and data analytics systems help these manufacturers control their processes and increase yield.

  • Automated Analysis Software

    RevospECT Pro - Zetec, Inc.

    RevospECT Pro is the industry’s first commercially available high-powered, adaptable and scalable automated analysis system. It provides end users the power and control to perform comprehensive automated analysis of eddy current data. RevospECT has a proven track record in the field and meets rigorous industry standards for flaw analysis from bobbin, rotating and array inspection techniques. Once configured for an inspection, RevospECT Pro will process and analyze data at an extremely fast rate utilizing its robust distributed processing power, often outpacing data acquisition rates and generating results that can be verified immediately by the reviewing data analyst. More importantly than system speed is the consistency of the results that are delivered using computer-aided analysis.

  • Inspection + Cleaning for High Volume Manufacturing Environments

    AVIT-2020 - FiberQA

    AVIT-2020 is a fully automated system that removes human subjectivity from the entire inspect-clean cycle. With integrated cleaning and fast, robotic mechanics, operators simply press the process button, allowing them to complete a week’s worth of inspections in just a couple of hours with almost zero active operation.

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